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eBook Nanoscale Phenomena in Ferroelectric Thin Films (Multifunctional Thin Film Series) epub

by Seungbum Hong

eBook Nanoscale Phenomena in Ferroelectric Thin Films (Multifunctional Thin Film Series) epub
  • ISBN: 1402076304
  • Author: Seungbum Hong
  • Genre: Engineering
  • Subcategory: Engineering
  • Language: English
  • Publisher: Springer; 2004 edition (January 31, 2004)
  • Pages: 288 pages
  • ePUB size: 1119 kb
  • FB2 size 1311 kb
  • Formats mbr mobi lit lrf


Ferroelectric Thin Films for Memory Applications: Nanoscale Characterization by Scanning Force Microscopy. Nanoscale Domain Dynamics in Ferroelectric Thin Films.

Ferroelectric Thin Films for Memory Applications: Nanoscale Characterization by Scanning Force Microscopy. Multifunctional Thin Film Series.

Start by marking Nanoscale Phenomena In Ferroelectric Thin Films (Multifunctional Thin Film Series) . This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, .

Start by marking Nanoscale Phenomena In Ferroelectric Thin Films (Multifunctional Thin Film Series) as Want to Read: Want to Read savin. ant to Read. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well- known le'adingexperts both in relevant academia and industry over the world This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films.

Автор: Seungbum Hong Название: Nanoscale Phenomena in Ferroelectric Thin Films Издательство: Springer .

Описание: Ferroelectric thin films continue to attract much attention due to their developing applications in memory devices, FeRAM, infrared sensors, piezoelectric sensors and actuators.

In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale .

In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy," Prof.

Specific focus is on nanoscale phenomena and relaxation dyanmics in model thin films using voltage modulated scanning force microscopy. A charge gradient microscopy (CGM) probe was used to collect surface screening charges on poly(vinylidene hylene) thin films. Nanomechanical properties of the morphotropic BiFeO3 thin films are characterized at the nanoscale, using a combination of scanning probe microscopy techniques.

ТОП 10 Самые сложные игры для DENDY - Продолжительность: 15:15 Space Sharks Recommended for you. 15:15. Полная история, часть 1 - Продолжительность: 19:24 BRIGHT FUTURE Recommended for you. 19:24.

Items related to Nanoscale Phenomena in Ferroelectric Thin Films . In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy," Prof.

Items related to Nanoscale Phenomena in Ferroelectric Thin Films (Multifuncti. Nanoscale Phenomena in Ferroelectric Thin Films (Multifunctional Thin Film Series). ISBN 13: 9781402076305.

Are you sure you want to remove Nanoscale Phenomena in Ferroelectric Thin Films (Multifunctional . Published January 31, 2004 by Springer. There's no description for this book yet.

Are you sure you want to remove Nanoscale Phenomena in Ferroelectric Thin Films (Multifunctional Thin Film Series) from your list? Nanoscale Phenomena in Ferroelectric Thin Films (Multifunctional Thin Film Series).

This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films

This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. This book provides the compass to navigate the unknown sea of information related to the nanoscale phenomena occurring in ferroelectric thin films.

This book provides the compass to navigate the unknown sea of information related to the nanoscale phenomena occurring in ferroelectric thin films.

This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well­ known le'adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high­ density memory products. In Chapter 2, "Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size," Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author's findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy," Prof. A.
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