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eBook CTL for Test Information of Digital ICs epub

by Rohit Kapur

eBook CTL for Test Information of Digital ICs epub
  • ISBN: 1402072937
  • Author: Rohit Kapur
  • Genre: Engineering
  • Subcategory: Engineering
  • Language: English
  • Publisher: Springer; 2002 edition (October 31, 2002)
  • Pages: 173 pages
  • ePUB size: 1655 kb
  • FB2 size 1864 kb
  • Formats azw lrf lrf txt


Authors: Kapur, Rohit.

Authors: Kapur, Rohit. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450. This book is focused on describing CTL.

Start by marking Ctl For Test Information Of Digital Ics as Want to Read . This book should be read by anyone who is interested in testing integrated circuits

Start by marking Ctl For Test Information Of Digital Ics as Want to Read: Want to Read savin. ant to Read. This book should be read by anyone who is interested in testing integrated circuits. The contents of this book are especially relevant to the segment of the industry that is developing cores and/or using cores in system-on-chip methodologies.

It is being developed as a standard within the IEEE framework. CTL for Test Information of Digital ICS is an example-oriented book on CTL that is written with the goal of getting the reader to think like the creators of CTL. Most of the explanations are limited to very simple examples so that the netlist (design) can be drawn out for better visualization of the concepts.

Rohit Kapur Synopsys, In. Testing of these ICs is performed using test equipment to apply stimulus to the ICs and observe the responses. CTL is designed for abstracting test information of designs for communication in an automation-friendly format or human-readable format.

Rohit Kapur Synopsys, Inc. Kluwer academic publishers. New york, boston, dordrecht, london, moscow. These tests are typically determined by ATPG-FS tools (software) that run on the design which is represented by primitives such as AND/NAND gates, OR/NOR gates, exclusive-OR gates, inverters, flip-flops, latches, RAM/ROMs, tri-states and others.

Finding books BookSee BookSee - Download books for free. CTL for Test Information of Digital ICS. Rohit Kapur.

This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields. Microelectronics Reliability show more. Microelectronics Reliability.

Автор: Kapur Rohit Название: CTL for Test Information of Digital ICS . 9. Examples Describing Test Information in CTL.

The contents of this book are especially relevant to the segment of the industry that is developing cores and/or using cores in system-on-chip methodologies.

Shipped in 8 to 10 working days. Hassle-Free Exchanges & Returns for 30 Days. 6-Month Limited Warranty. It contains two types of example CTL syntax. Please note that Takealot relies on the relevant brand to provide us with accurate featured content for this product. Customers Who Bought This Product, Also Bought. Customers Also Bought.

From the reviews: "[…] a welcome addition to the literature. […] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability

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